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(A) Traction coefficient (1 – s) follows the predicted scaling (dotted line) for all experimental conditions. (B) Transition in slip is observed at a gap width of ~20 nm. Data summarize experiments across all rotation frequencies and field conditions. (C) Electron micrograph of a single <t>colloidal</t> <t>particle</t> and representative <t>AFM</t> image and surface roughness profile insets; the dashed line is the average height (all corrected for curvature). (D) Instantaneous velocity measurements from representative data in (B) show a stick– slip behavior at length scales less than or equal to the particle surface roughness (Video S4).
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(A) Traction coefficient (1 – s) follows the predicted scaling (dotted line) for all experimental conditions. (B) Transition in slip is observed at a gap width of ~20 nm. Data summarize experiments across all rotation frequencies and field conditions. (C) Electron micrograph of a single <t>colloidal</t> <t>particle</t> and representative <t>AFM</t> image and surface roughness profile insets; the dashed line is the average height (all corrected for curvature). (D) Instantaneous velocity measurements from representative data in (B) show a stick– slip behavior at length scales less than or equal to the particle surface roughness (Video S4).
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(A) Traction coefficient (1 – s) follows the predicted scaling (dotted line) for all experimental conditions. (B) Transition in slip is observed at a gap width of ~20 nm. Data summarize experiments across all rotation frequencies and field conditions. (C) Electron micrograph of a single <t>colloidal</t> <t>particle</t> and representative <t>AFM</t> image and surface roughness profile insets; the dashed line is the average height (all corrected for curvature). (D) Instantaneous velocity measurements from representative data in (B) show a stick– slip behavior at length scales less than or equal to the particle surface roughness (Video S4).
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(A) Traction coefficient (1 – s) follows the predicted scaling (dotted line) for all experimental conditions. (B) Transition in slip is observed at a gap width of ~20 nm. Data summarize experiments across all rotation frequencies and field conditions. (C) Electron micrograph of a single <t>colloidal</t> <t>particle</t> and representative <t>AFM</t> image and surface roughness profile insets; the dashed line is the average height (all corrected for curvature). (D) Instantaneous velocity measurements from representative data in (B) show a stick– slip behavior at length scales less than or equal to the particle surface roughness (Video S4).
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(A) Traction coefficient (1 – s) follows the predicted scaling (dotted line) for all experimental conditions. (B) Transition in slip is observed at a gap width of ~20 nm. Data summarize experiments across all rotation frequencies and field conditions. (C) Electron micrograph of a single <t>colloidal</t> <t>particle</t> and representative <t>AFM</t> image and surface roughness profile insets; the dashed line is the average height (all corrected for curvature). (D) Instantaneous velocity measurements from representative data in (B) show a stick– slip behavior at length scales less than or equal to the particle surface roughness (Video S4).
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(A) Traction coefficient (1 – s) follows the predicted scaling (dotted line) for all experimental conditions. (B) Transition in slip is observed at a gap width of ~20 nm. Data summarize experiments across all rotation frequencies and field conditions. (C) Electron micrograph of a single <t>colloidal</t> <t>particle</t> and representative <t>AFM</t> image and surface roughness profile insets; the dashed line is the average height (all corrected for curvature). (D) Instantaneous velocity measurements from representative data in (B) show a stick– slip behavior at length scales less than or equal to the particle surface roughness (Video S4).
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Image Search Results


(A) Traction coefficient (1 – s) follows the predicted scaling (dotted line) for all experimental conditions. (B) Transition in slip is observed at a gap width of ~20 nm. Data summarize experiments across all rotation frequencies and field conditions. (C) Electron micrograph of a single colloidal particle and representative AFM image and surface roughness profile insets; the dashed line is the average height (all corrected for curvature). (D) Instantaneous velocity measurements from representative data in (B) show a stick– slip behavior at length scales less than or equal to the particle surface roughness (Video S4).

Journal: Langmuir : the ACS journal of surfaces and colloids

Article Title: ac/dc Magnetic Fields for Enhanced Translation of Colloidal Microwheels

doi: 10.1021/acs.langmuir.8b04084

Figure Lengend Snippet: (A) Traction coefficient (1 – s) follows the predicted scaling (dotted line) for all experimental conditions. (B) Transition in slip is observed at a gap width of ~20 nm. Data summarize experiments across all rotation frequencies and field conditions. (C) Electron micrograph of a single colloidal particle and representative AFM image and surface roughness profile insets; the dashed line is the average height (all corrected for curvature). (D) Instantaneous velocity measurements from representative data in (B) show a stick– slip behavior at length scales less than or equal to the particle surface roughness (Video S4).

Article Snippet: To determine particle surface roughness, particle suspensions were dried on glass slides, and an atomic force microscopy (AFM) (Asylum Research, Santa Barbara, CA) was used in air tapping mode with a silicon probe with a resonant frequency of 190 kHz and a spring constant of 48 N/m (Tap190E-G, BudgetSensors, Sofia, Bulgaria).

Techniques: